ELI Beamlines has sold a patent license abroad

ELI Beamlines has sold a patent license abroad

Jaroslav Nejdl, the leader of the research team developing X-ray sources at ELI Beamlines, invented a unique concept how to characterize the XUV beam using a new instrument that combines profilometer and spectrometer function. "The invention is based on a new optical design that allows the beam intensity profile and its spectrum to be measured using a single detector. It simplifies the diagnostic setup considerably, as it was formerly consisting of a spectrometer and a profilometer, each with its detector, which is usually an X-ray camera for tens of thousands euros, ”says J. Nejdl.

The invention was created to solve the internal needs of the scientific team and just then the idea was patented. While the market for such specialized devices is not large, the demand for such innovations is still growing. This is evidenced by the fact that we were contacted by a German company interested in the license. After negotiations on the terms and conditions, a contract was signed with the company Dr. Hoerlein & Partner GbR at the beginning of 2019.
The contract is important for us not only as a source of finance (thanks to license fees), but also proves that ELI Beamlines has the potential to bring the interesting and beneficial inventions for applications. The industrial partner is able to improve his product portfolio significantly.

 

Pictures

  1. Graph
  2. Spectrometer for detection of 6-25 nm
  3. Spectrometer for detection of 20-45 nm